Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, Sspr & Spr 2010, Cesme, Izmir, Turkey, August 18-20, 2010, Proceedings

Hancock, Edwin R. (Editor)

ISBN 10: 3642149790 ISBN 13: 9783642149795
Published by Springer-Verlag New York Inc, 2010
Language: English
Condition: New Soft cover

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