Structural, Syntactic, and Statistical Pattern Recognition (Paperback)

Terry Caelli

ISBN 10: 3540440119 / ISBN 13: 9783540440116

Published by Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2002

About this Item

Paperback. This book constitutes the refereed proceedings of the 9th International Workshop on Structural and Syntctic Pattern Recognition, SSPR 2002 and the 4th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2002 held jointly in Windsor, Ontario, Canada in August 2002. The 45 revised full papers and 35 poster papers presented together with three invited papers were carefully reviewed and selected from 116 submissions. The papers are organized in topical sections on graphs, grammars, and languages; graphs, strings, and grammars; documents and OCR; image shape analysis and application; density estimation and distribution models; multi classifiers and fusion; feature extraction and selection; general methodology; and image shape analysis and application. This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

Seller Inventory # 9783540440116

Bibliographic Details

• Title: Structural, Syntactic, and Statistical Pattern Recognition (Paperback)
• Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin
• Publication Date: 2002
• Language: English
• ISBN 10: 3540440119
• ISBN 13: 9783540440116
• Binding: Paperback
• Condition: new

About this title

Synopsis

This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. This was the third time these two workshops were held back-to-back. SSPR was the ninth International Workshop on Structural and Syntactic Pattern Recognition and the SPR was the fourth International Workshop on Statis- cal Techniques in Pattern Recognition. These workshops have traditionally been held in conjunction with ICPR (International Conference on Pattern Recog- tion), and are the major events for technical committees TC2 and TC1, resp- tively, of the International Association of Pattern Recognition (IAPR). The workshops were held in parallel and closely coordinated. This was an attempt to resolve the dilemma of how to deal, in the light of the progressive specialization of pattern recognition, with the need for narrow-focus workshops without further fragmenting the ?eld and introducing yet another conference that would compete forthe time and resources of potential participants. A total of 116 papers were received from many countries with the submission and reviewingprocesses beingcarried out separately for each workshop. A total of 45 papers were accepted for oral presentation and 35 for posters. In addition four invited speakers presented informative talks and overviews of their research. They were: Tom Dietterich, Oregon State University, USA Sven Dickinson, the University of Toronto, Canada Edwin Hancock, University of York, UK Anil Jain, Michigan State University, USA SSPR 2002 and SPR 2002 were sponsored by the IAPR and the University of Windsor.