Surface Analysis (Introduction) (XPS and AES)(Chinese Edition)

YING WO CI Watts J.F. YING WO SI TENG HUO MU Wolstenholme J.

ISBN 10: 7562822263 / ISBN 13: 9787562822264

About this Item

Paperback. Pub Date: 2008 Pages: 144 Language: Chinese in Publisher: East China University of Science and Technology Press. the book tells the story of modern electron spectroscopy in monochromated XPS small area. XPS (SAXPS). imaging XPS. XPS depth profiling. field emission features such as AES / SAM analysis technology. as well as in the metallurgical. corrosion applications in the field of ceramics. catalyst. microelectronics. semiconductor materials. adhesives. coatings. polymer materials.

Seller Inventory # CB008161

Bibliographic Details

• Title: Surface Analysis (Introduction) (XPS and AES)(Chinese Edition)
• Language: Chinese
• ISBN 10: 7562822263
• ISBN 13: 9787562822264
• Binding: paperback
• Condition: New

About this title

Synopsis

Paperback. Pub Date: 2008 Pages: 144 Language: Chinese in Publisher: East China University of Science and Technology Press. the book tells the story of modern electron spectroscopy in monochromated XPS small area. XPS (SAXPS). imaging XPS. XPS depth profiling. field emission features such as AES / SAM analysis technology. as well as in the metallurgical. corrosion applications in the field of ceramics. catalyst. microelectronics. semiconductor materials. adhesives. coatings. polymer materials ; modern electronic energy spectrometer in microfocus monochromator. field emitters. plasma gun. an electron gun. the energy analyzer / transfer lens. charged compensator. multi-channel detector. parallel imaging system. the parallel data acquisition. the data processing system and so on. The book XPS and. AES technology and other surface analysis techniques were compared. Book with ref...