Surface and Interface Characterization by Electron Optical Methods

Language: English

Published by Springer US, 2012

1461595398 / 9781461595397

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electro.

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Title
Surface and Interface Characterization by Electron Optical Methods
Author
Valdre, Ugo
Publisher
Springer US
Publication year
2012
Condition
New
Binding
Soft cover
Language
English
ISBN 10
1461595398
ISBN 13
9781461595397

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
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