Surface Roughness Study by Atomic Force Microscopy: Surface.
Language: English
Published by LAP LAMBERT Academic Publishing, 2012
- Softcover
- New

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- Title
- Surface Roughness Study by Atomic Force Microscopy: Surface.
- Author
- Sayeed, Md.Abu; Ferdous, Zakia
- Publisher
- LAP LAMBERT Academic Publishing
- Publication year
- 2012
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 3848400359
- ISBN 13
- 9783848400355
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.
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About the Author
Md.Abu Sayeed has completed his Bachelor of science in Electrical & Electronic Engineering from Khulna University of Engineering & Technology,Bangladesh.
"About the title" may belong to another edition of this title.
Majestic Books
Hounslow, United Kingdom
4-star seller
AbeBooks seller since January 19, 2007
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