Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition

Gernot Friedbacher

ISBN 10: 3527320474 / ISBN 13: 9783527320479

Published by Wiley-VCH, 2011

About this Item

Leichte Kratzer / Abnutzungen / Druckstellen. Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

Seller Inventory # 4df04885-8227-4e1a-987c-76e50d493fbb

Bibliographic Details

• Title: Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition
• Publisher: Wiley-VCH
• Publication Date: 2011
• Language: English
• ISBN 10: 3527320474
• ISBN 13: 9783527320479
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: As New
• Seller catalogs:
  • Chemistry

About this title

Synopsis

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)

About the Author

Gernot Friedbacher is Associate Professor of Analytical Chemistry at the Vienna University of Technology. His research activities are focused on investigation of surfaces and surface processes with scanning probe microscopy and electron probe x-ray microanalysis covering a broad field of applications ranging from basic research on thin film systems to materials science. Over the last decades he has held numerous theoretical and practical courses in the field of analytical chemistry with emphasis on intstrumental analysis and surface- and interface analysis. Prof. Friedbacher has published over 120 research articles, reviews, and book chapters.

Henning Bubert worked at the Institut für Analytische Wissenschaften - ISAS - (Institute for Analytical Sciences) in Dortmund until his retirement in 2003. He is currently working as guest scientist. His research activities are mainly focused on investigation of surfaces and thin films by electron spectroscopy related to the development and application of new materials in mechanical engineering. He has published over 110 research articles, reviews, and book chapters.