TESTING OF eSRAM USING MMC- Algorithm And Parasitic Extraction Method

Language: English

Published by LAP LAMBERT Academic Publishing Dez 2017, 2017

6202095466 / 9786202095464

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -The intention of the book is to highlight core issues of current technology relevant to embedded SRAM, testing methods and need of new test requirements. The importance of March algorithms and in depth working including examples were clearly shown. The failures of existing March algorithms and hence the development of MMC- (Modified March C-) algorithm will increase the reader interest in exploring much more test algorithms required for e-SRAM. Above this, the testing method using Parasitic extraction of R & C developed using Cadence tools and Microwind is highlight of the investigations. The layout level parasitic extraction of R&C method was applied on all possible SRAM fault models using 'bridge/short' created in electrical circuit environment. Using parasitic memory effect, fault detection dictionary was an outcome this research in which each fault model behavior is highlighted in terms of R & C at different technology nodes. The chosen technology nodes are 90nm, 120nm, and 180nm. This method was extended to few two cell fault models and discussed on coupling faults. 252 pp. Englisch.…

Seller Inventory # 9786202095464

Title
TESTING OF eSRAM USING MMC- Algorithm And Parasitic Extraction Method
Author
Muddapu Parvathi
Publisher
LAP LAMBERT Academic Publishing Dez 2017
Publication year
2017
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
6202095466
ISBN 13
9786202095464
Item weight
393 grams
Dimensions
220x150x16 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany