Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance

Hennen, Leonhard (Edited by)/ Hahn, Julia (Edited by)/ Ladikas, Miltos (Edited by)/ Lindner, Ralf (Edited by)/ Peissl, Walter (Edited by)/ van Est, Rinie (Edited by)

ISBN 10: 3031106164 ISBN 13: 9783031106163
Published by Springer, 2023
Language: English
Condition: New Hardcover

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