Test Case Generation using behavioral & Interaction models

Vikas Panthi

ISBN 10: 3659260177 / ISBN 13: 9783659260179

Published by LAP LAMBERT Academic Publishing Okt 2012, 2012

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -In this Book, we have primarily focused on test case generation of object-oriented software from State Chart diagram Diagram. We have also explored the technique for Test Scenarios Generation using Sequence Diagram. Using Java program, we are generating Test Scenarios, we are also generating corresponding EFSM. It is an partial automatic approach of testing. Our book immensely encourages the approach of Model Based Testing, which is on demand for large scale software development. 88 pp. Englisch.

Seller Inventory # 9783659260179

Bibliographic Details

• Title: Test Case Generation using behavioral & Interaction models
• Publisher: LAP LAMBERT Academic Publishing Okt 2012
• Publication Date: 2012
• Language: English
• ISBN 10: 3659260177
• ISBN 13: 9783659260179
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 6D millimeters 220 millimeters width by 150 millimeters height by 6 millimeters depth
• Weight: 149 grams

About this title

Synopsis

In this Book, we have primarily focused on test case generation of object-oriented software from State Chart diagram Diagram. We have also explored the technique for Test Scenarios Generation using Sequence Diagram. Using Java program, we are generating Test Scenarios, we are also generating corresponding EFSM. It is an partial automatic approach of testing. Our book immensely encourages the approach of Model Based Testing, which is on demand for large scale software development.

About the Author

Vikas Panthi is a Ph.D. research scholar at National Institute of Technology Rourkela India. He had completed M.Tech in Software Engineering from National Institute of Technology,Rourkela. He had received B.E from Samrat Ashok Technological Institute, Vidisha. His research interest includes Software Engineering, DBMS, TOC.