Test Data Engineering

Kojiro Shojima

ISBN 10: 9811699852 / ISBN 13: 9789811699856

Published by Springer Nature Singapore Aug 2022, 2022

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students' abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers' perspective on test data analysis. 604 pp. Englisch.

Seller Inventory # 9789811699856

Bibliographic Details

• Title: Test Data Engineering
• Publisher: Springer Nature Singapore Aug 2022
• Publication Date: 2022
• Language: English
• ISBN 10: 9811699852
• ISBN 13: 9789811699856
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 38D millimeters 241 millimeters width by 160 millimeters height by 38 millimeters depth
• Weight: 1062 grams

About this title

Synopsis

This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students’ abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers’ perspective on test data analysis.

 

About the Author

Kojiro Shojima is Associate Professor at The National Center for University Entrance Examinations. He is a psychometrician living in Tokyo with his (lovely) wife and two (angelic) daughters.