Test and Diagnosis for Small-Delay Defects

Mohammad Tehranipoor

ISBN 10: 1441982965 / ISBN 13: 9781441982964

Published by Springer New York, Springer New York, 2011

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Seller Inventory # 9781441982964

Bibliographic Details

• Title: Test and Diagnosis for Small-Delay Defects
• Publisher: Springer New York, Springer New York
• Publication Date: 2011
• Language: English
• ISBN 10: 1441982965
• ISBN 13: 9781441982964
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 18D millimeters 241 millimeters width by 160 millimeters height by 18 millimeters depth
• Weight: 518 grams

About this title

Synopsis

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

About the Author

This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
 
This book presents new techniques and methodologies to improve overall SDD detection with very small pattern sets. These methods can result in pattern counts as low as a traditional 1-detect pattern set and long path sensitization and SDD detection similar to or even better than n-detect or timing-aware pattern sets. The important design parameters and pattern-induced noises such as process variations, power supply noise (PSN) and crosstalk are taken into account in the methodologies presented. A diagnostic flow is also presented to identify whether the failure is caused by PSN, crosstalk, or a combination of these two effects.

• Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects;
• Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies;
• Shows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flow.