Test-Driven Development
Language: English
Published by APress, US, 2004
- Softcover
- New

Seller: Rarewaves.com USA, London, London, United KingdomRarewaves.com USA
AbeBooks seller since June 11, 2025
Condition: New
US$ 45.52
Quantity: 8 available
Add to basketItem description from seller
While basic techniques of test-driven development are simple to understand, real-world application requires knowledge of tools and techniques to effectively create, run and organize tests. This book bridges the gap between simple concepts and complex application. Ideal for Java developers, this book explains how to use test-driven development to improve J2EE construction. Not version-specific, this unprecedented book explains development tools and methodologies in conjunction with real-world cases and examples. It includes the use of open source unit testing frameworks such as JUnit and its extensions. The authors include complete stages: test coverage strategies, test organization, TDD incorporation, and automation. Two appendices are also included, for test planning and reference.
Seller Inventory # LU-9781590593271
- Title
- Test-Driven Development
- Author
- Thomas Hammell, David Gold, Tom Snyder
- Publisher
- APress, US
- Publication year
- 2004
- Condition
- New
- Binding
- Paperback
- Language
- English
- ISBN 10
- 1590593278
- ISBN 13
- 9781590593271
While basic techniques of test-driven development are simple to understand, real-world application requires knowledge of tools and techniques to effectively create, run and organize tests. This book bridges the gap between simple concepts and complex application. Ideal for Java developers, this book explains how to use test-driven development to improve J2EE construction.
Not version-specific, this unprecedented book explains development tools and methodologies in conjunction with real-world cases and examples. It includes the use of open source unit testing frameworks such as JUnit and its extensions. The authors include complete stages: test coverage strategies, test organization, TDD incorporation, and automation. Two appendices are also included, for test planning and reference.
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