Testability Concepts for Digital ICs

Language: English

Published by Springer US, 1995

0792396588 / 9780792396581

Series: Book 1 of 40 - Frontiers in Electronic Testing

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a.

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Title
Testability Concepts for Digital ICs
Author
F.P.M. Beenker|R.G. Bennetts|A.P. Thijssen
Publisher
Springer US
Publication year
1995
Condition
New
Binding
Gebunden
Language
English
ISBN 10
0792396588
ISBN 13
9780792396581
Series
Book 1 of 40: Frontiers in Electronic Testing

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
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