Testing of Communicating Systems : 18th IFIP TC6/WG6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006, Proceedings

Uyar, M. Umit (EDT); Duale, Ali Y. (EDT); Fecko, Mariusz A. (EDT)

ISBN 10: 3540341846 ISBN 13: 9783540341840
Published by Springer, 2006
Language: English
Condition: New Soft cover

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