Testing Embedded System

Language: English

Published by LAP LAMBERT Academic Publishing, 2019

3330331178 / 9783330331174

  • Softcover
  • New
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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Dr. NeeleshDr. Neelesh Kumar Jain, is working as a Professor and Head, Department of Computer Applications, in Sagar Institute of Research & Technology, Bhopal, He has published seven books and has published more than 15 researc.

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Title
Testing Embedded System
Author
Dr. Neelesh Jain
Publisher
LAP LAMBERT Academic Publishing
Publication year
2019
Condition
New
Binding
Soft cover
Language
English
ISBN 10
3330331178
ISBN 13
9783330331174
Dimensions
1.7 x 22 x 15
Seller catalogs
Mathematik/Naturwissenschaften/Technik/Medizin

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First itemUS$ 56.27US$ 56.27
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