Testing Semiconductor Memories: Theory and Practice
Language: English
Published by A.J. van de Goor, 1998
- Hardcover
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Hardcover
Condition: Used - Good
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- Title
- Testing Semiconductor Memories: Theory and Practice
- Author
- van de Goor, A.J.
- Publisher
- A.J. van de Goor
- Publication year
- 1998
- Condition
- Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 9080427616
- ISBN 13
- 9789080427617
Goor (EE, Delft U.) presents memory test models on the chip, array, and board level. For each a class of fault models is introduced together with opposite tests. He particularly stresses the appropriateness of fault models to their class. Annotation copyright Book News, Inc. Portland, Or.
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