Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)

Hamdioui, Said

ISBN 10: 1441954309 / ISBN 13: 9781441954305

Published by Springer, 2010

About this Item

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Seller Inventory # ria9781441954305_new

Bibliographic Details

• Title: Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
• Publisher: Springer
• Publication Date: 2010
• Language: English
• ISBN 10: 1441954309
• ISBN 13: 9781441954305
• Binding: Soft cover
• Condition: New

About this title

Synopsis

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.
Features:
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.

Review

From the reviews:

"Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. ... This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. ... The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. ... The book promises to make valuable contribution to the education of graduate students ... . I highly recommend this book ... ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)