Testing Static Random Access Memories

Language: English

Published by Springer US, Copernicus Mär 2004, 2004

1402077521 / 9781402077524

Series: Book 38 of 40 - Frontiers in Electronic Testing

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This item is printed on demand - Print on Demand Titel. Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.Features:Fault primitive based analysis of memory faultsA complete framework of and classification memory faultsA systematic way to develop optimal and high quality memory test algorithmsA systematic way to develop test patterns for any multi-port SRAMChallenges and trends in embedded memory testing.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch.

Seller Inventory # 9781402077524

Title
Testing Static Random Access Memories
Author
Said Hamdioui
Publisher
Springer US, Copernicus Mär 2004
Publication year
2004
Condition
Neu
Binding
Buch
Language
English
ISBN 10
1402077521
ISBN 13
9781402077524
Item weight
535 grams
Dimensions
241x160x18 mm
Series
Book 38 of 40: Frontiers in Electronic Testing

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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