Theoretical Foundations and Numerical Methods for Sparse Recovery

Language: English

Published by De Gruyter, De Gruyter Jul 2010, 2010

3110226146 / 9783110226140

Series: Book 5 of 28 - Radon Series on Computational and Applied Mathematics

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -The present collection is the very first contribution of this type in the field of sparse recovery. Compressed sensing is one of the important facets of the broader concept presented in the book, which by now has made connections with other branches such as mathematical imaging, inverse problems, numerical analysis and simulation. The book consists of four lecture notes of courses given at the Summer School on 'Theoretical Foundations and Numerical Methods for Sparse Recovery' held at the Johann Radon Institute for Computational and Applied Mathematics in Linz, Austria, in September 2009. This unique collection will be of value for a broad community and may serve as a textbook for graduate courses. From the contents: 'Compressive Sensing and Structured Random Matrices' by Holger Rauhut 'Numerical Methods for Sparse Recovery' by Massimo Fornasier 'Sparse Recovery in Inverse Problems' by Ronny Ramlau and Gerd Teschke 'An Introduction to Total Variation for Image Analysis' by Antonin Chambolle, Vicent Caselles, Daniel Cremers, Matteo Novaga and Thomas Pock 352 pp. Englisch.…

Seller Inventory # 9783110226140

Title
Theoretical Foundations and Numerical Methods for Sparse Recovery
Author
Massimo Fornasier
Publisher
De Gruyter, De Gruyter Jul 2010
Publication year
2010
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3110226146
ISBN 13
9783110226140
Item weight
776 grams
Dimensions
246x175x24 mm
Series
Book 5 of 28: Radon Series on Computational and Applied Mathematics

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
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BuchWeltWeit Ludwig Meier e.K.

Germany