Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Language: English
Published by Springer, 2022
- Hardcover
- New

Condition: New
US$ 227.74
Quantity: 2 available
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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. Sprache: Englisch Gewicht in Gramm: 435.
Seller Inventory # IB-2067567
- Title
- Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
- Author
- Cheng Qian, Rui Du, Xiong Du, Gaoxian Li, Jun Zhang, Yaoyi Yu
- Publisher
- Springer
- Publication year
- 2022
- Condition
- Neu
- Binding
- Gebundene Ausgabe
- Language
- English
- ISBN 10
- 9811931313
- ISBN 13
- 9789811931314
- Item weight
- 435 grams
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