Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Language: English

Published by Springer, 2022

9811931313 / 9789811931314

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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. Sprache: Englisch Gewicht in Gramm: 435.

Title
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Author
Cheng Qian, Rui Du, Xiong Du, Gaoxian Li, Jun Zhang, Yaoyi Yu
Publisher
Springer
Publication year
2022
Condition
Neu
Binding
Gebundene Ausgabe
Language
English
ISBN 10
9811931313
ISBN 13
9789811931314
Item weight
435 grams

Home-set

Mannheim, Germany

5-star seller

AbeBooks seller since April 13, 2026

Shipping rates from Germany to U.S.A.

Item10 to 12 business days8 to 10 business days
First itemUS$ 55.00US$ 82.66
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Home-set

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