Thin Films: Study of Electronic and Optical Propertiesof Al1-xInxSb Thin Films

Toda, Yogesh; Gujarathi, Dhananjay

ISBN 10: 6202793953 / ISBN 13: 9786202793957

Published by LAP LAMBERT Academic Publishing, 2020

About this Item

Seller Inventory # 26404589510

Bibliographic Details

• Title: Thin Films: Study of Electronic and Optical Propertiesof Al1-xInxSb Thin Films
• Publisher: LAP LAMBERT Academic Publishing
• Publication Date: 2020
• Language: English
• ISBN 10: 6202793953
• ISBN 13: 9786202793957
• Binding: Soft cover
• Condition: New

About this title

Synopsis

Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled “Study of Electronic and Optical Properties of Al1-xInxSb Thin Films” consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc.