Thoughtful Machine Learning: A Test-Driven Approach
Kirk, Matthew
Sold by BooksRun, Philadelphia, PA, U.S.A.
AbeBooks Seller since February 2, 2016
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Add to basketSold by BooksRun, Philadelphia, PA, U.S.A.
AbeBooks Seller since February 2, 2016
Condition: Used - Fair
Quantity: 1 available
Add to basketThe item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
Seller Inventory # 1449374069-7-1
Learn how to apply test-driven development (TDD) to machine-learning algorithms—and catch mistakes that could sink your analysis. In this practical guide, author Matthew Kirk takes you through the principles of TDD and machine learning, and shows you how to apply TDD to several machine-learning algorithms, including Naive Bayesian classifiers and Neural Networks.
Machine-learning algorithms often have tests baked in, but they can’t account for human errors in coding. Rather than blindly rely on machine-learning results as many researchers have, you can mitigate the risk of errors with TDD and write clean, stable machine-learning code. If you’re familiar with Ruby 2.1, you’re ready to start.
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