Tolerance Analysis of Electronic Circuits Using MATHCAD

Robert (University of California Boyd

ISBN 10: 0849323398 / ISBN 13: 9780849323393

Published by Taylor & Francis Inc Sep 1999, 1999

About this Item

Neuware - Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCAD offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards. Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q AC circuits. TOC:Root Sum Square and Extreme Value Analysis.- Monte Carlo Analysis.- Advanced Topics.- Appendix.

Seller Inventory # 9780849323393

Bibliographic Details

• Title: Tolerance Analysis of Electronic Circuits Using MATHCAD
• Publisher: Taylor & Francis Inc Sep 1999
• Publication Date: 1999
• Language: English
• ISBN 10: 0849323398
• ISBN 13: 9780849323393
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 165W x 111H x 12D millimeters 165 millimeters width by 111 millimeters height by 12 millimeters depth
• Weight: 160 grams

About this title

Synopsis

Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCADä offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:

worst-case analysis,

limits for production testing,

component stress analysis,

determining if a design meets specification limits, and

manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.

About the Author

Boyd, Robert