Tolerance Analysis of Electronic Circuits Using MATLAB

Robert Boyd

ISBN 10: 0849322766 / ISBN 13: 9780849322761

Published by Taylor & Francis Inc Jun 1999, 1999

About this Item

Neuware - Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATLAB offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including worst-case analysis, limits for production testing, component stress analysis, determining if a design meets specification limits, and manufacturing yield analysis. TOC:Root-Sum-Square and Extreme Value Analysis.- Monte Carlo Analysis.- Appendix.- References.

Seller Inventory # 9780849322761

Bibliographic Details

• Title: Tolerance Analysis of Electronic Circuits Using MATLAB
• Publisher: Taylor & Francis Inc Jun 1999
• Publication Date: 1999
• Language: English
• ISBN 10: 0849322766
• ISBN 13: 9780849322761
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 165W x 108H x 0D millimeters 165 millimeters width by 108 millimeters height by 0 millimeters depth
• Weight: 300 grams

About this title

Synopsis

Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATLAB offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:

worst-case analysis,

limits for production testing,

component stress analysis,

determining if a design meets specification limits, and

manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.

About the Author

Robert R. Boyd was a technical instructor in the United States Air Force for 19 years. Upon his retirement from the Air Force in 1971, he enrolled at the University of New Mexico and obtained a BSEE degree with honors in 1974. Mr. Boyd was employed in the aerospace industry in anlog circuit design until 1996. He is presently a consultant in analog circuit design and analysis and teaches a course in the tolerance analysis of electronic circuits at the University of California Extension (Irvine, CA).