Transmission Electron Microscopy and Diffractometry of Materials

James Howe

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Language: English

Published by Springer Berlin Heidelberg Okt 2012, 2012

3642297609 / 9783642297601

Series: Book 38 of 126 - Graduate Texts in Physics

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. 784 pp. Englisch.…

Seller Inventory # 9783642297601

Title
Transmission Electron Microscopy and Diffractometry of Materials
Author
James Howe
Publisher
Springer Berlin Heidelberg Okt 2012
Publication year
2012
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3642297609
ISBN 13
9783642297601
Edition
4th Edition
Item weight
1,326 grams
Dimensions
241x160x47 mm
Series
Book 38 of 126: Graduate Texts in Physics

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany