Transmission Electron Microscopy: Physics of Image Formation and Microanalysis. Springer Series in Optical Sciences, Volume 36.

Reimer, Ludwig:

ISBN 10: 3540568492 / ISBN 13: 9783540568490

Published by Berlin, Springer, 1993

About this Item

545 p. Ehemaliges Bibliotheksexemplar mit Signatur und Stempel. Buch in akzeptablen Zustand mit mittlere Gebrauchsspuren. Buchblock Beschädigt! 9783540568490 Sprache: Englisch Gewicht in Gramm: 930.

Seller Inventory # 203702

Bibliographic Details

• Title: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis. Springer Series in Optical Sciences, Volume 36.
• Publisher: Berlin, Springer
• Publication Date: 1993
• Language: English
• ISBN 10: 3540568492
• ISBN 13: 9783540568490
• Binding: Softcover
• Edition: 3rd Edition
• Seller catalogs:
  • U Physik

About this title

Synopsis

1. Introduction.- 2. Particle Optics of Electrons.- 3. Wave Optics of Electrons.- 4. Elements of a Transmission Electron Microscope.- 5. Electron-Specimen Interactions.- 6. Scattering and Phase Contrast for Amorphous Specimens.- 7. Kinematical and Dynamical Theory of Electron Diffraction.- 8. Diffraction Contrast and Crystal-Structure Imaging.- 9. Analytical Electron Microscopy.- 10. Specimen Damage by Electron Irradiation.- References.