Transmission Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 36)

Reimer, Ludwig

ISBN 10: 3540504990 / ISBN 13: 9783540504993

Published by Springer, 1989

About this Item

Zustand: Sehr gut | Seiten: 560 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Seller Inventory # 42295726/202

Bibliographic Details

• Title: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 36)
• Publisher: Springer
• Publication Date: 1989
• Language: English
• ISBN 10: 3540504990
• ISBN 13: 9783540504993
• Binding: Soft cover
• Edition: 2nd Edition
• Condition: Sehr gut
• Seller catalogs:
  • Bücher

About this title

Synopsis

The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.