Transmission Electron Microscopy: A Textbook for Materials Science (Springer Series in Nuclear and Particle Physics)

Dey, Mira; Dey, Jishnu

ISBN 10: 0387567909 / ISBN 13: 9780387567907

Published by Springer Verlag, 1994

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Seller Inventory # mon0003861186

Bibliographic Details

• Title: Transmission Electron Microscopy: A Textbook for Materials Science (Springer Series in Nuclear and Particle Physics)
• Publisher: Springer Verlag
• Publication Date: 1994
• ISBN 10: 0387567909
• ISBN 13: 9780387567907
• Binding: hardcover
• Condition: Good

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Synopsis

Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to 'See' Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.