Ultrasensitive Magnetometry and Imaging with NV Diamond | Electron Paramagnetic Resonance of Nitrogen Vacancy. This item is unavailable.
Language: English
Published by LAP Lambert Academic Publishing, 2012
- Softcover
- New

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Ultrasensitive Magnetometry and Imaging with NV Diamond | Electron Paramagnetic Resonance of Nitrogen Vacancy | Changdong Kim | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2012 | LAP Lambert Academic Publishing | EAN 9783847319979 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu.
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- Title
- Ultrasensitive Magnetometry and Imaging with NV Diamond | Electron Paramagnetic Resonance of Nitrogen Vacancy
- Author
- Changdong Kim
- Publisher
- LAP Lambert Academic Publishing
- Publication year
- 2012
- Condition
- Neu
- Binding
- Taschenbuch
- Language
- English
- ISBN 10
- 3847319973
- ISBN 13
- 9783847319979
- Item weight
- 198 grams
- Dimensions
- 220 x 150 x 8 mm
- Seller catalogs
- Bücher
NV centers in a diamond are proving themselves to be good building blocks for quantum information, electron spin resonance (ESR) imaging, and sensor applications. The key feature of the NV is that it has an electron spin that can be polarized and read out at room temperature. The readout is optical, thus the magnetic field imaging can also be done easily. Magnetic field variation with feature sizes below 0.3 microns cannot be directly resolved, and so in this region magnetic resonance imaging must be employed. To realize the full sensitivity of NV diamond, the spin transition linewidth must be as narrow as possible. Additionally, in the case of NV ensembles for micron-sized magnetometers, there must be a high concentration of NV. To this end three techniques are explored: (1) Electron paramagnetic resonance (EPR) imaging with microwave field gradients, (2) Magic angle rotation of magnetic field, and (3) TEM irradiation to optimize the yield of NV in a diamond.
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About the Author
Changdong Kim received his B.S. in electrical engineering from Korea University, Seoul, Korea in 2000. From 2000 to 2003, he was with Samsung Electronics, where he was a research engineer in the Optical Communication Lab. He received his M.S. in 2005 and Ph.D. in 2010 in electrical engineering at Texas A&M University.
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