Understanding Semiconductor Devices (The Oxford Series in Electrical and Computer Engineering)
Language: English
Published by Oxford University Press, 2000
- Hardcover
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Hardcover
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- Title
- Understanding Semiconductor Devices (The Oxford Series in Electrical and Computer Engineering)
- Author
- Dimitrijev, Sima
- Publisher
- Oxford University Press
- Publication year
- 2000
- Condition
- Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 019513186X
- ISBN 13
- 9780195131864
Ideal for undergraduate and beginning graduate students in electrical engineering, Understanding Semiconductor Devices provides a solid grounding in both fundamental principles and practical skills. The text features intuitive explanations and a motivating "electronics-to-physics" approach that progresses from basic to more abstract concepts. It includes intriguing and diverse problems, review questions, and worked out examples.
· Part I: The Fundamentals introduces students to essential material (semiconductor theory, diodes, MOSFETs, and BJTs) without assuming extensive prerequisite knowledge.
· Part II: Advanced Topics covers the specifics of deep submicron MOSFET, photonic, microwave, and power devices and introduces advanced technologies, device reliability, and quantum mechanics.
Bridging the gap between theory and practice, Understanding Semiconductor Devices incorporates the "nuts and bolts" of SPICE (models and parameters) and provides links between theoretical principles and real-life issues like reliability and device parameter measurement.
· Part I: The Fundamentals introduces students to essential material (semiconductor theory, diodes, MOSFETs, and BJTs) without assuming extensive prerequisite knowledge.
· Part II: Advanced Topics covers the specifics of deep submicron MOSFET, photonic, microwave, and power devices and introduces advanced technologies, device reliability, and quantum mechanics.
Bridging the gap between theory and practice, Understanding Semiconductor Devices incorporates the "nuts and bolts" of SPICE (models and parameters) and provides links between theoretical principles and real-life issues like reliability and device parameter measurement.
"Synopsis" may belong to another edition of this title.
About the Author
Sima Dimitrijev is at Griffith University.
"About the title" may belong to another edition of this title.
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