VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Gaur, Singh Manoj (Edited by)/ Zwolinski, Mark (Edited by)/ Laxmi, Vijay (Edited by)/ Boolchandani, D. (Edited by)/ Sing, Virendra (Edited by)/ Singh, Adit (Edited by)

ISBN 10: 3642420230 / ISBN 13: 9783642420238

Published by Springer, 2013

About this Item

2013 edition. 396 pages. 9.50x6.25x1.00 inches. In Stock.

Seller Inventory # x-3642420230

Bibliographic Details

• Title: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
• Publisher: Springer
• Publication Date: 2013
• Language: English
• ISBN 10: 3642420230
• ISBN 13: 9783642420238
• Binding: Paperback
• Condition: Brand New
• Weight: 0.6 kilograms

About this title

Synopsis

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.