Title: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Communications in Computer and Information Science)
Publisher: Springer 2013-12-10
Publication Date: 2013
Language: English
ISBN 10: 3642420230
ISBN 13: 9783642420238
Binding: Paperback
Condition: New

About this title

Synopsis

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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