VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers

Brajesh Kumar Kaushik (u. a.)

ISBN 10: 9811074690 / ISBN 13: 9789811074691

Published by Springer, 2017

About this Item

VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers | Brajesh Kumar Kaushik (u. a.) | Taschenbuch | xxi | Englisch | 2017 | Springer | EAN 9789811074691 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 111011620

Bibliographic Details

• Title: VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
• Publisher: Springer
• Publication Date: 2017
• Language: English
• ISBN 10: 9811074690
• ISBN 13: 9789811074691
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 45D millimeters 235 millimeters width by 155 millimeters height by 45 millimeters depth
• Weight: 1247 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.