VLSI Design and Test | 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

S. Rajaram (u. a.)

ISBN 10: 9811359490 / ISBN 13: 9789811359491

Published by Springer, 2019

About this Item

VLSI Design and Test | 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers | S. Rajaram (u. a.) | Taschenbuch | xviii | Englisch | 2019 | Springer | EAN 9789811359491 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 115080588

Bibliographic Details

• Title: VLSI Design and Test | 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
• Publisher: Springer
• Publication Date: 2019
• Language: English
• ISBN 10: 9811359490
• ISBN 13: 9789811359491
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 40D millimeters 235 millimeters width by 155 millimeters height by 40 millimeters depth
• Weight: 1101 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.