VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

Anirban Sengupta

ISBN 10: 9813297662 / ISBN 13: 9789813297661

Published by Springer, Springer, 2019

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Seller Inventory # 9789813297661

Bibliographic Details

• Title: VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
• Publisher: Springer, Springer
• Publication Date: 2019
• Language: English
• ISBN 10: 9813297662
• ISBN 13: 9789813297661
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 43D millimeters 235 millimeters width by 155 millimeters height by 43 millimeters depth
• Weight: 1177 grams

About this title

Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.