VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Language: English
Published by Springer 2019-08, 2019
Series: Book 284 of 578 - Communications in Computer and Information Science
- Softcover
- New

Seller: Chiron Media, Wallingford, United KingdomChiron Media
AbeBooks seller since August 2, 2010
Condition: New
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- Title
- VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
- Author
- Sengupta, Anirban
- Publisher
- Springer 2019-08
- Publication year
- 2019
- Condition
- New
- Binding
- PF
- Language
- English
- ISBN 10
- 9813297662
- ISBN 13
- 9789813297661
- Series
- Book 284 of 578: Communications in Computer and Information Science
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
"Synopsis" may belong to another edition of this title.
Chiron Media
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AbeBooks seller since August 2, 2010
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