Title: VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Publisher: Springer 2019-08
Publication Date: 2019
Language: English
ISBN 10: 9813297662
ISBN 13: 9789813297661
Binding: PF
Condition: New

About this title

Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

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