VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4¿6, 2019, Revised Selected Papers

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ISBN 10: 9813297662 / ISBN 13: 9789813297661

Published by Springer Nature Singapore, 2019

About this Item

Zustand: Gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

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Bibliographic Details

• Title: VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4¿6, 2019, Revised Selected Papers
• Publisher: Springer Nature Singapore
• Publication Date: 2019
• Language: English
• ISBN 10: 9813297662
• ISBN 13: 9789813297661
• Binding: Soft cover
• Condition: Gut
• Seller catalogs:
  • Bücher

About this title

Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.