VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17 19, 2022, Revised Selected Papers: 1687 (Communications in Computer and Information Science, 1687)

Shah, Ambika Prasad (Editor) / Dasgupta, Sudeb (Editor) / Darji, Anand (Editor) / Tudu, Jaynarayan (Editor)

ISBN 10: 3031215133 / ISBN 13: 9783031215131

Published by Springer, 2022

About this Item

614 pages. 9.25x6.10x1.42 inches. In Stock.

Seller Inventory # x-3031215133

Bibliographic Details

• Title: VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17 19, 2022, Revised Selected Papers: 1687 (Communications in Computer and Information Science, 1687)
• Publisher: Springer
• Publication Date: 2022
• Language: English
• ISBN 10: 3031215133
• ISBN 13: 9783031215131
• Binding: Paperback
• Condition: Brand New
• Weight: 0.93 kilograms

About this title

Synopsis

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.

The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.