Title: VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
Publisher: Springer 2022-12
Publication Date: 2022
Language: English
ISBN 10: 303121515X
ISBN 13: 9783031215155
Binding: PF
Condition: New

About this title

Synopsis

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.

The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

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