VLSI Design and Test | 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers

Ambika Prasad Shah (u. a.)

ISBN 10: 3031215133 / ISBN 13: 9783031215131

Published by Springer, 2022

About this Item

VLSI Design and Test | 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers | Ambika Prasad Shah (u. a.) | Taschenbuch | Communications in Computer and Information Science | xviii | Englisch | 2022 | Springer | EAN 9783031215131 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 125728347

Bibliographic Details

• Title: VLSI Design and Test | 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
• Publisher: Springer
• Publication Date: 2022
• Language: English
• ISBN 10: 3031215133
• ISBN 13: 9783031215131
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 33D millimeters 235 millimeters width by 155 millimeters height by 33 millimeters depth
• Weight: 920 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.

The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.