VLSI Design and Test

Manoj Singh Gaur

ISBN 10: 3642420230 / ISBN 13: 9783642420238

Published by Springer Berlin Heidelberg Dez 2013, 2013

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology. 404 pp. Englisch.

Seller Inventory # 9783642420238

Bibliographic Details

• Title: VLSI Design and Test
• Publisher: Springer Berlin Heidelberg Dez 2013
• Publication Date: 2013
• Language: English
• ISBN 10: 3642420230
• ISBN 13: 9783642420238
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 22D millimeters 235 millimeters width by 155 millimeters height by 22 millimeters depth
• Weight: 610 grams

About this title

Synopsis

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.