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Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Softcover
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Item description from seller
pp. 406.
Seller Inventory # 2697807506
- Title
- VLSI Design and Test
- Publisher
- Springer
- Publication year
- 2013
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 3642420230
- ISBN 13
- 9783642420238
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
"Synopsis" may belong to another edition of this title.
Books Puddle
Woodside, NY, U.S.A.
4-star seller
AbeBooks seller since November 22, 2018
Shipping rates within U.S.A.
| Item | 12 to 19 business days | 12 to 14 business days |
|---|---|---|
| First item | US$ 3.99 | US$ 6.99 |
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I mainly carry imported books from South East Asia / South Asia for readers of all Age Groups.
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South Asian and South East Asian Culture, Religion, Art etcSeller's business information
PLETOS INC
6931 51st Avenue, WOODSIDE
Woodside, NY U.S.A. 11377
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We accept return for those books which are received damaged. Though we take appropriate care in packing to avoid such situation.