VLSI Fault Modeling and Testing Techniques

Language: English

Published by Ablex Publishing Corp., 1993

0893917818 / 9780893917814

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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits designing CMOS gates to test open faults testing bridging faults in VLSI and testable design synthesis.

Seller Inventory # 447101356

Title
VLSI Fault Modeling and Testing Techniques
Author
Zobrist, George W.
Publisher
Ablex Publishing Corp.
Publication year
1993
Condition
New
Binding
Gebunden
Language
English
ISBN 10
0893917818
ISBN 13
9780893917814

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First itemUS$ 54.67US$ 54.67
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Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268