VLSI-SoC: Design for Reliability, Security, and Low Power

Youngsoo Shin

ISBN 10: 331946096X / ISBN 13: 9783319460963

Published by Springer International Publishing, Springer International Publishing Sep 2016, 2016

About this Item

Neuware -This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 240 pp. Englisch.

Seller Inventory # 9783319460963

Bibliographic Details

• Title: VLSI-SoC: Design for Reliability, Security, and Low Power
• Publisher: Springer International Publishing, Springer International Publishing Sep 2016
• Publication Date: 2016
• Language: English
• ISBN 10: 331946096X
• ISBN 13: 9783319460963
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 19D millimeters 241 millimeters width by 160 millimeters height by 19 millimeters depth
• Weight: 530 grams

About this title

Synopsis

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.