VLSI-SoC: Forward-Looking Trends in IC and Systems Design

Jose L. Ayala

ISBN 10: 3642441750 / ISBN 13: 9783642441752

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Apr 2014, 2014

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 368 pp. Englisch.

Seller Inventory # 9783642441752

Bibliographic Details

• Title: VLSI-SoC: Forward-Looking Trends in IC and Systems Design
• Publisher: Springer Berlin Heidelberg, Springer Berlin Heidelberg Apr 2014
• Publication Date: 2014
• Language: English
• ISBN 10: 3642441750
• ISBN 13: 9783642441752
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 20D millimeters 235 millimeters width by 155 millimeters height by 20 millimeters depth
• Weight: 557 grams

About this title

Synopsis

This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.