VLSI-SoC: Technologies for Systems Integration

Jürgen Becker

ISBN 10: 3642270727 / ISBN 13: 9783642270727

Published by Springer Berlin Heidelberg Nov 2013, 2013

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains extended and revised versions of the best papers presented at the 17th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2009, held in Florianópolis, Brazil, in October 2009. The 8 papers included in the book together with two keynote talks were carefully reviewed and selected from 27 papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research addressing the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems. 212 pp. Englisch.

Seller Inventory # 9783642270727

Bibliographic Details

• Title: VLSI-SoC: Technologies for Systems Integration
• Publisher: Springer Berlin Heidelberg Nov 2013
• Publication Date: 2013
• Language: English
• ISBN 10: 3642270727
• ISBN 13: 9783642270727
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 12D millimeters 235 millimeters width by 155 millimeters height by 12 millimeters depth
• Weight: 330 grams

About this title

Synopsis

This book contains extended and revised versions of the best papers presented at the 17th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2009, held in Florianópolis, Brazil, in October 2009. The 8 papers included in the book together with two keynote talks were carefully reviewed and selected from 27 papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research addressing the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.