VLSI Test Principles and Architectures
ISBN 10: 9385358421 ISBN 13: 9789385358425
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This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Seller Inventory # ABNR-171233
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Title: VLSI Test Principles and Architectures
Condition: New
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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)).
Published by
Morgan Kaufmann., 2006
ISBN 10: 0123705975
ISBN 13: 9780123705976
Used
Hardcover
First Edition
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
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1st ed. 21 x 24 cm. 808 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. Seller Inventory # 6394VB
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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Seller: Goodwill Books, Hillsboro, OR, U.S.A.
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Condition: good. Signs of wear and consistent use. Seller Inventory # GICWV.0123705975.G
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Seller: HPB-Red, Dallas, TX, U.S.A.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_444968426
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Seller: diakonia secondhand, München, Germany
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Condition: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm. Seller Inventory # 34773
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VLSI Test Principles and Architectures,: Design for Testability (Systems on Silicon)
Published by
Morgan Kaufmann 2006-08-14, 2006
ISBN 10: 0123705975
ISBN 13: 9780123705976
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Hardcover
Seller: Chiron Media, Wallingford, United Kingdom
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Hardcover. Condition: New. Seller Inventory # 6666-ELS-9780123705976
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VLSI Test Principles and Architectures: Design for Testability
Print on DemandSeller: Brook Bookstore On Demand, Napoli, NA, Italy
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Condition: new. Questo è un articolo print on demand. Seller Inventory # 71e8e6509fa75136872c3990418e9a62
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VLSI Test Principles and Architectures
Seller: Majestic Books, Hounslow, United Kingdom
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Condition: New. pp. xxx + 777 Illus. Seller Inventory # 8277367
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VLSI Test Principles And Architectures: Design for Testability
Seller: Revaluation Books, Exeter, United Kingdom
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Hardcover. Condition: Brand New. 1st edition. 777 pages. 9.25x7.50x2.00 inches. In Stock. Seller Inventory # __0123705975
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VLSI Test Principles and Architectures
Seller: Books Puddle, New York, NY, U.S.A.
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Condition: New. pp. xxx + 777. Seller Inventory # 26651944
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VLSI Test Principles and Architectures
Seller: Biblios, Frankfurt am main, HESSE, Germany
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Condition: New. pp. xxx + 777. Seller Inventory # 18651938
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