Vapor Generation Techniques for Trace Element Analysis: Fundamental Aspects
Language: English
Published by Elsevier, 2022
- Softcover
- New

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- Title
- Vapor Generation Techniques for Trace Element Analysis: Fundamental Aspects
- Publisher
- Elsevier
- Publication year
- 2022
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0323858341
- ISBN 13
- 9780323858342
Vapor Generation Techniques for Trace Element Analysis: Fundamental Aspects provides an overview and discussion of the fundamental aspects governing derivatization reactions of trace-level elements for analytical purposes. Vapor generation techniques coupled with atomic or mass spectrometry have been employed for over 50 years, but their popularity has dramatically increased in recent years, especially as alternative vapor generation approaches have been developed. This book bridges the knowledge gap of the derivatization mechanisms that yield volatile compounds and provides an update on recent developments in vapor generation techniques used for the determination and speciation of trace elements by atomic optical and mass spectrometry.
It will serve as a comprehensive, single-source overview of recent developments, providing readers with an understanding of the correct implementation―and limitations―of applying vapor generation techniques to everyday analytical problems facing the trace element analyst.
- Covers reaction mechanisms and fundamental processes of vapor generation in detail
- Includes classical and alternative vapor generation approaches: alkylation, chelation, plasma, photochemical and electrochemical
- Guides the interpretation of experimental results and implementation of vapor generation techniques in the laboratory
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About the Author
Ralph Sturgeon’s technical interests lie in inorganic analytical chemistry, comprising trace element analysis, vapor generation, organometallic speciation and production of Certified Reference Materials with a focus on atomic and mass spectrometric detection. He has published some 330 peer reviewed articles, is past Editor for Spectrochimica Acta Reviews and currently serves on the advisory boards of several international analytical chemistry journals. For more than 20 years Sturgeon has interacted extensively with the international metrology community, serving on working groups affiliated with both ISO and the BIPM while actively participating in audits of National Metrology Institute laboratories throughout the world. His contributions to analytical atomic spectroscopy have been recognized through a number of awards, including most recently the 2019 CSI Award. He was peer ranked amongst the top 10 most influential analytical spectroscopists for 2017 by the Analytical Scientist.
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