Vlsi Reliability (V L S I ELECTRONICS), VLSI electronics microstructure Science. Vol. 22
Language: English
Published by Academic Press Inc, 1990
- Hardcover
- Used
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207 Seiten Ausgetragenes Bibliotheksexemplar, grüner Leineneinband mit Titelprägung in schwarz und weiss, Einband minimal berieben, Papier in sehr gutem Zustand B02-01-02C Sprache: Englisch Gewicht in Gramm: 459.
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- Title
- Vlsi Reliability (V L S I ELECTRONICS), VLSI electronics microstructure Science. Vol. 22
- Author
- Sabnis, Anant G.:
- Publisher
- Academic Press Inc
- Publication year
- 1990
- Condition
- Sehr gut
- Binding
- 4°, Gebundene Ausgabe
- Language
- English
- ISBN 10
- 0122341228
- ISBN 13
- 9780122341229
- Item weight
- 459 grams
- Seller catalogs
- Elektrotechnik
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
"Synopsis" may belong to another edition of this title.
Review
Dr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits.
--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories
--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories
"About the title" may belong to another edition of this title.
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