Vlsi Reliability (V L S I ELECTRONICS), VLSI electronics microstructure Science. Vol. 22

Sabnis, Anant G.:

ISBN 10: 0122341228 / ISBN 13: 9780122341229

Published by Academic Press Inc, 1990

About this Item

207 Seiten Ausgetragenes Bibliotheksexemplar, grüner Leineneinband mit Titelprägung in schwarz und weiss, Einband minimal berieben, Papier in sehr gutem Zustand B02-01-02C Sprache: Englisch Gewicht in Gramm: 459.

Seller Inventory # 1873550

Bibliographic Details

• Title: Vlsi Reliability (V L S I ELECTRONICS), VLSI electronics microstructure Science. Vol. 22
• Publisher: Academic Press Inc
• Publication Date: 1990
• Language: English
• ISBN 10: 0122341228
• ISBN 13: 9780122341229
• Binding: 4°, Gebundene Ausgabe
• Condition: Sehr gut
• Weight: 459 grams
• Seller catalogs:
  • Elektrotechnik

About this title

Synopsis

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.

Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification

Review

Dr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits.
--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories