Worked Examples in X-Ray Analysis

Jenkins

ISBN 10: 1489926496 / ISBN 13: 9781489926494

Published by Springer New York, Springer New York, 2013

About this Item

Druck auf Anfrage Neuware - Printed after ordering - The purpose of this book is to provide the reader with a series of work ed examples in X -ray spectrometry and X -ray diffractometry, in such a way that each example can be treated either as a posed question, i. e. one to which the reader must himself provide an answer, or as a guide to the method of treating a similar problem. The latter, of course, also pro vides a check on the answer produced by the reader. Although much basic theory can be derived by study of this work the first intention of the book is not to provide a source of basic theoretical knowledge in X -ray analy sis. It is hoped that the book will be utilized more as a guide line in the tackling of theoretical and practical problems and as a means of estab lishing whether or not the reader is able to work out for himself a certain type of problem. For example, the series of examples on counting statis tics has been chosen in such a way that after working through and under standing these, the reader should be able to handle most of the calculations that he is likely to come up against in this area.

Seller Inventory # 9781489926494

Bibliographic Details

• Title: Worked Examples in X-Ray Analysis
• Publisher: Springer New York, Springer New York
• Publication Date: 2013
• Language: English
• ISBN 10: 1489926496
• ISBN 13: 9781489926494
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 216W x 140H x 9D millimeters 216 millimeters width by 140 millimeters height by 9 millimeters depth
• Weight: 196 grams

About this title

Synopsis

The purpose of this book is to provide the reader with a series of work­ ed examples in X -ray spectrometry and X -ray diffractometry, in such a way that each example can be treated either as a posed question, i. e. one to which the reader must himself provide an answer, or as a guide to the method of treating a similar problem. The latter, of course, also pro­ vides a check on the answer produced by the reader. Although much basic theory can be derived by study of this work the first intention of the book is not to provide a source of basic theoretical knowledge in X -ray analy­ sis. It is hoped that the book will be utilized more as a guide line in the tackling of theoretical and practical problems and as a means of estab­ lishing whether or not the reader is able to work out for himself a certain type of problem. For example, the series of examples on counting statis­ tics has been chosen in such a way that after working through and under­ standing these, the reader should be able to handle most of the calculations that he is likely to come up against in this area.